ADTRAN 1200287L1 Manual de usuario Pagina 162

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Appendix A. Acceptance Test Procedure
A-10 MX2810 M13 User Manual 61185001L1-1
MAJOR and MINOR Alarm Relay Test
This test will actuate the MAJOR and MINOR alarm relay contacts.
1. Ensure that the DS3 is not in alarm (DS3 STATUS LED is solid Green
on the Active Controller). The easiest way to do this is to once again
re-install a hard loopback of the DS3 toward the MX2810.
2. Ensure that the 28 DS1s are out of alarm. The easiest way to
accomplish this is as follows:
At the DSX-1 cross-connect, insert the TRANSMIT of the DS1 test
set into the INPUT of the first DS1 channel of the MX2810. Install
a Bantam test cord from the OUTPUT of the first DS1 channel to
the INPUT of the second DS1 channel. Then connect a second
Bantam test cord from the OUTPUT of the second DS1 channel to
the INPUT of the third DS1.
Repeat this procedure for all 28 DS1 channels. Connect the
OUTPUT of the 28th DS1 channel to the RECEIVE of the DS1 test
set. Configure the test set for ESF/B8ZS and run a standard BERT
test using QRSS or other preferred test pattern(s).
3. At this point, nothing should be in alarm (DS1 STATUS LEDs are all
solid Green on the Active Controller). Remove any one of the
Bantam cords from the DSX bay. This will cause a DS1 LOS alarm,
which will result in the actuation of the MAJOR alarm relay. Also,
since the DS3 is hard looped back on itself, i.e., the DS3 is not in
alarm, a FEAC alarm will occur to signify an alarm at the DS1 level
reported by the far end (C-Bit framing enables this feature), resulting
in the actuation of the MINOR alarm relay.
4. Verify that the MAJOR and MINOR alarms are being properly
reported to the Office alarm monitoring equipment.
VERIFICATION OF SYSTEM REDUNDANCY
This section will address the redundancy features of the MX2810. The
MX2810 supports redundancy of both the Power Supply and Controller
Modules. The equipment configuration (non-redundant Vs redundant and
type of power redundancy) will be useful in determining what can and
cannot be tested. The following sections describe the tests for various
configurations.
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